Please use this identifier to cite or link to this item: http://210.212.227.212:8080/xmlui/handle/123456789/460
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dc.contributor.authorAshik, Naushad-
dc.contributor.authorShafi, K A-
dc.date.accessioned2023-10-07T06:44:51Z-
dc.date.available2023-10-07T06:44:51Z-
dc.date.issued2023-05-
dc.identifier.urihttp://210.212.227.212:8080/xmlui/handle/123456789/460-
dc.description.abstractThe aim of the experiments is to measure the resistance of commonly used materials like aluminium, copper, and nichrome at both room temperature and cryogenic temperature (77K). To achieve this, an experimental setup will be developed using instruments such as the kelvin double bridge and LCR meter. Another setup will be created to measure the resistance of the materials as they are cooled from room temperature to 77K, and the measurements will be continued as the materials are gradually warmed back up. By analyzing these measurements, we can determine how the resistance of the materials changes at different temperatures. These experimental setups will provide valuable information on the resistance characteristics of materials at different temperatures, potentially leading to new applications in cryogenic cooling technology for medical and diagnostic purposes. The experiment conducted with BSCCO 2223 (HTS) using different constant currents (100mA, 200mA, 500mA, and 1000mA) demonstrated an average transition temperature of 104K, which falls within the reported range of BSCCO 2223's Tc in various literature, validating the reliability of the proposed experimental setup. Furthermore, aluminium and copper show a significant decrease in resistance at cryogenic temperatures, while nichrome's resistance remains relatively stable at 77K. This suggests that, in general, resistance materials experience minimal changes in resistance when exposed to cryogenic temperatures. Although there is a slight variation in resistivity compared to literature values for all three tested materials, the experimental values still follow a consistent trend in resistance with temperature, as described in the literature.en_US
dc.language.isoenen_US
dc.relation.ispartofseries;TKM21MEIR04-
dc.titleDEVELOPMENT OF EXPERIMENTAL SET UP FOR MEASUREMENT OF ELECTRICAL RESISTANCE AT LOW TEMPERATUREen_US
dc.typeTechnical Reporten_US
Appears in Collections:2023

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